XUV interferometry using high-order harmonics: Application to plasma diagnostics

Year: 2001

Authors: Hergott J.-F., Salières P., Merdji H., Le Déroff L., Carré B., Auguste T., Monot P., D\’Oliveira P., Descamps D., Norin J., Lyng C., L’Huillier A., Wahlström C.-G., Bellini M., Huller S.

Autors Affiliation: Service des Photons, Atomes et Molécules, CEA-DSM-DRECAM, Centre de Saclay, 91191 Gif-sur-Yvette, France; Department of Physics, Lund Institute of Technology, P.O. Box 118, S-221 00 Lund, Sweden; L.E.N.S., Largo E. Fermi, 2, I-50125 Florence, Italy; Centre de Physique Théorique, CNRS, Ecole Polytechnique, 91128 Palaiseau, France; Service des Photons, Atomes et Molécules, Bât. 524, Centre de Saclay, 91191 Gif-sur-Yvette, France

Abstract: In this paper, we present and compare the two different XUV interferometric techniques using high-order harmonics that have been developed so far. The first scheme is based on the interference between two spatially separated phase-locked harmonic sources while the second uses two temporally separated harmonic sources. These techniques have been applied to plasma diagnostics in feasibility experiments where electron densities up to a few 1020 e-/cm3 have be measured with a temporal resolution of 200 fs. We present the main characteristics of each technique and discuss their respective potentials and limitations.

Journal/Review: LASER AND PARTICLE BEAMS

Volume: 19 (1)      Pages from: 35  to: 40

KeyWords: Electron density measurement; Harmonic generation; Interferometry; Refractive index; Ultraviolet radiation, Harmonic radiation; High order harmonics; Temporal resolution, Plasma diagnostics
DOI: 10.1017/S0263034601191056

ImpactFactor: 0.518
Citations: 7
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