Terahertz Frequency Metrology for Spectroscopic Applications: a Review

Year: 2017

Authors: Consolino L., Bartalini S., De Natale P.

Autors Affiliation: CNR-Istituto Nazionale di Ottica Largo E Fermi 6, I-50125 Florence, Italy

Abstract: We provide an overview on terahertz (THz) frequency metrology, starting from the nowadays available continuous wave THz sources, discussing their main features such as tunability, spectral purity, and frequency referencing to the primary frequency standards. A comparison on the achieved results in high-precision molecular spectroscopy is given and discussed, and finally, a special emphasis poses on the future developments of this upcoming field.

Journal/Review: JOURNAL OF INFRARED MILLIMETER AND TERAHERTZ WAVES

Volume: 38 (11)      Pages from: 1289  to: 1315

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KeyWords: Frequency standards; Molecular spectroscopy; Terahertz spectroscopy; Units of measurement, Continuous-wave thz; CW THz sourc; High-precision; High-precision spectroscopy; Primary frequency standard; Spectral purity; Spectroscopic application; Terahertz frequencies, Terahertz waves
DOI: 10.1007/s10762-017-0406-x

ImpactFactor: 1.677
Citations: 41
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