Does interferometer monitor thickness or optical-path variations?

Year: 1998

Authors: Ferraro P.

Autors Affiliation: IPSIA

Journal/Review: JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS

Volume: 36 (4)      Pages from: 198  to: 198

KeyWords: light interferometers; glass; thickness measurement; refractive index; thermal expansion
DOI: 10.1119/1.880036