Laser spectral characterization in multiphoton microscopy

Year: 2004

Authors: Quercioli F., Tiribilli B., Vassalli M., Ghirelli A.

Autors Affiliation: Istituto Nazionale di Ottica Applicata, Laboratorio di Biophotonica, Largo E. Fermi 6, Firenze 50125, Italy

Abstract: Spectral and temporal characterization is a fundamental task when a tunable Ti:sapphire ultrafast laser system is operated for multiphoton microscopy applications. In the present paper simple procedures are reported that perform laser-peak-emission wavelength and bandwidth measurements without the need of any further instrumentation but a simple and inexpensive diffraction grating, by taking advantage of the confocal microscope imaging capabilities. (C) 2004 Optical Society of America.

Journal/Review: APPLIED OPTICS

Volume: 43 (15)      Pages from: 3055  to: 3060

KeyWords: Bandwidth; Diffraction gratings; Imaging systems; Microscopic examination; Photons; Spectrum analysis; Ultrafast phenomena, Multiphoton microscopy; Spectral distribution; Temporal characterization; Ultrafast lasers, Laser optics, article; comparative study; confocal microscopy; equipment; equipment design; evaluation; image enhancement; instrumentation; methodology; multiphoton microscopy; refractometry; reproducibility; sensitivity and specificity; statistics; validation study, Equipment Design; Equipment Failure Analysis; Image Enhancement; Microscopy, Confocal; Microscopy, Fluorescence, Multiphoton; Refractometry; Reproducibility of Results; Sensitivity and Specificity
DOI: 10.1364/AO.43.003055

ImpactFactor: 1.799
Citations: 2
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