Noise effects on excitable chaotic attractors in coupled light-emitting diodes
Year: 2012
Authors: Abdalah S., Ciszak M., Marino F., Al-Naimee K., Meucci R., Arecchi F. T.
Autors Affiliation: CNR – Istituto Nazionale di Ottica, Largo E. Fermi 6, 50125 Firenze, Italy; High Institute of Telecommunications and Post, Al Salihiya, Baghdad, Iraq; Istituto dei Sistemi Complessi – CNR, Via Madonna del Piano 10,
I-50019 Sesto Fiorentino – Firenze (Italy); Physics Department, College of Science, University of Baghdad, Al Jadiriah, Baghdad, Iraq
Abstract: Recent studies demonstrated that chaotic spike sequences appearing in the context of incomplete homoclinic scenarios can be understood in terms of excitability of chaotic attractors. So far, this particular dynamic has been found in a semiconductor laser with optoelectronic feedback. Here, we show that the same phenomenology occurs also in light-emitting diodes, which are ideal candidates for the implementation of a complex network on a chip. In particular, we study the appearance of both stochastic incoherence (SI) and stochastic coherence (SC) in a single unit, as well as in two coupled units. We demonstrate experimentally and explore numerically the enhancement of SC and worsening of SI induced by coupling systems in array.
Journal/Review: IEEE SYSTEMS JOURNAL
Volume: 6 (3) Pages from: 558 to: 563
More Information: This work was supported in part by the Ente Cassa di Risparmio di Firenze, under Contract Dinamiche cerebrali caotiche. The work of S. F. Abdalah was supported by ICTP-TRIL. The work of M. Ciszak was supported by a Marie Curie European Reintegration Grant, under a 7th European Community Framework Program.KeyWords: Chaotic spiking; coupled systems; excitability of attractors; light-emitting diodes; noiseDOI: 10.1109/JSYST.2012.2190691ImpactFactor: 1.270Citations: 6data from “WEB OF SCIENCE” (of Thomson Reuters) are update at: 2024-11-10References taken from IsiWeb of Knowledge: (subscribers only)Connecting to view paper tab on IsiWeb: Click hereConnecting to view citations from IsiWeb: Click here