Fractal characteristics of far-field diffraction patterns for two-dimensional Thue-Morse quasicrystals
Year: 2011
Authors: Yang M.Y., Zhou J., Petti L., De Nicola S., Mormile P.
Autors Affiliation: Ningbo Univ, Fac Sci, Inst Photon, Ningbo 315211, Zhejiang, Peoples R China; Ist Cibernet E Caianiello Consiglio Nazl Ric, I-80078 Pozzuoli, Na, Italy; Ist Nazl Ottica Consiglio Nazl Ric, I-80078 Pozzuoli, Na, Italy.
Abstract: We report a numerical method to analyze the fractal characteristics of far-field diffraction patterns for two-dimensional Thue-Morse (2-D TM) structures. The far-field diffraction patterns of the 2-D TM structures can be obtained by the numerical method, and they have a good agreement with the experimental ones. The analysis shows that the fractal characteristics of far-field diffraction patterns for the 2-D TM structures are determined by the inflation rule, which have potential applications in the design of optical diffraction devices.
Journal/Review: OPTOELECTRONICS LETTERS
Volume: 7 (5) Pages from: 346 to: 349
More Information: This work has been supported by the National Natural Science Foundation of China (No.60977048), the International Bilateral Italy-China Joint Projects (CNR/CAS Agreement 2008-2010), the International Collaboration Program of Ningbo (No.2010D10018) and the K. C. Wong Magna Fund in Ningbo University, China.KeyWords: fractalDOI: 10.1007/s11801-011-1057-0
