Nanocrystals as precursors for flexible functional films

Year: 2005

Authors: Cademartiri L., von Freymann G., Arsenault AC., Bertolotti J., Wiersma D., Kitaev V., Ozin GA.

Autors Affiliation: Univ Toronto, Dept Chem, Lash Miller Chem Labs, Mat Chem Res Grp, Toronto, ON M5S 3H6, Canada; European Lab Nonlinear Spectroscopy, I-50019 Florence, Italy; INFM, I-50019 Florence, Italy;
Wilfrid Laurier Univ, Dept Chem, Waterloo, ON N2L 3C5, Canada

Abstract: A general strategy for obtaining tailorable and patternable films of densely packed nanocrystals, was investigated using the as-prepared nanocrystals as precursors. A solution containing PbS nanocrystals and the excess pbCl 2-OLA complex was repeatedly drop-cast onto a glass slide until a thick film was formed. The film composed of densely packed nanocrystals separated by the OLA capping ligands. The film was then exposed to a 5-W air plasma for 48 h, after which it was lifted off the substrate without damage. The morphology and the nanoscopic organization of the films was investigated using TEM and scanning electron microscopy (SEM). The nanocrystals formed ordered superstructures, with cubic symmetry. The peak in the small-angle X-ray scattering (SAXS) curve indicated the presence of a residual order in the packing of the nanocrystals. The surface-to-surface distance between nanocrystals was found between 1 and 3 nm.

Journal/Review: SMALL

Volume: 1 (12)      Pages from: 1184  to: 1187

KeyWords: Crystals; Lead compounds; Molecular structure; Scanning electron microscopy; Substrates; Transmission electron microscopy, Lead chalcogenides; Lead sulfides; Nanocrystals; Plasma chemistry, Nanostructured materials, argon; cadmium chloride; cadmium derivative; cadmium sulfide; ion; nanomaterial; nanoparticle; sulfide, article; chemistry; Fourier analysis; instrumentation; light; materials testing; methodology; nanotechnology; scanning electron microscopy; temperature; transmission electron microscopy; X ray diffraction, Argon; Cadmium Chloride; Cadmium Compounds; Fourier Analysis; Ions; Light; Materials Testing; Microscopy, Electron, Scanning; Microscopy, Electron, Transmission; Nanoparticles; Nanostructures; Nanotechnology; Sulfides; Temperature; X-Ray Diffraction
DOI: 10.1002/smll.200500206

Citations: 39
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