Optical micro-profilometry for cultural heritage applications
Year: 2009
Authors: Daffara C., Gambino M.C., Fontana R., Pampaloni E., Pezzati L.
Autors Affiliation: CNR – Istituto Nazionale di Ottica, Largo E. Fermi 6, 50125 Florence, Italy
Journal/Review: JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS
KeyWords: microprofilometry