Optical micro-profilometry for cultural heritage applications

Year: 2009

Authors: Daffara C., Gambino M.C., Fontana R., Pampaloni E., Pezzati L.

Autors Affiliation: CNR – Istituto Nazionale di Ottica, Largo E. Fermi 6, 50125 Florence, Italy

Journal/Review: JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS

KeyWords: microprofilometry