Metrological Detection of Multipartite Entanglement from Young Diagrams
Year: 2021
Authors: Ren Z.; Li W.; Smerzi A.; Gessner M.
Autors Affiliation: Shanxi Univ, Inst Theoret Phys, Taiyuan 030006, Peoples R China; Shanxi Univ, State Key Lab Quantum Opt & Quantum Opt Devices, Dept Phys, Collaborat Innovat Ctr Extreme Opt, Taiyuan 030006, Peoples R China; Sorbonne Univ, Univ PSL, Coll France, Lab Kastler Brossel,ENS,CNRS, 24 Rue Lhomond, F-75005 Paris, France; INO CNR, QSTAR, Largo Enrico Fermi 2, I-50125 Florence, Italy; LENS, Largo Enrico Fermi 2, I-50125 Florence, Italy.
Abstract: We characterize metrologically useful multipartite entanglement by representing partitions with Young diagrams. We derive entanglement witnesses that are sensitive to the shape of Young diagrams and show that Dyson?s rank acts as a resource for quantum metrology. Common quantifiers, such as the entanglement depth and k-separability are contained in this approach as the diagram?s width and height. Our methods are experimentally accessible in a wide range of atomic systems, as we illustrate by analyzing published data on the quantum Fisher information and spin-squeezing coefficients.
Journal/Review: PHYSICAL REVIEW LETTERS
Volume: 126 (8) Pages from: 080502-1 to: 080502-6
KeyWords: metrology; quantum entanglementDOI: 10.1103/PhysRevLett.126.080502ImpactFactor: 9.185Citations: 36data from “WEB OF SCIENCE” (of Thomson Reuters) are update at: 2024-09-15References taken from IsiWeb of Knowledge: (subscribers only)
