Near-field measurement of short-range correlation in optical waves transmitted through random media

Year: 2003

Authors: Emiliani V., Intonti F., Wiersma D., Colocci M., Cazayous M., Lagendijk A., Aliev F.

Autors Affiliation: INFM and LENS, Via Nello Carrara 1, 50019 Firenze, Italy; University Paul Sabatier, 31062 Toulouse, France; Department of Applied Physics, MESA + Research Institute, University of Twente, 7500 AE Enschede, Netherlands; University of Puerto Rico, San Juan, Puerto Rico

Abstract: Two-dimensional near-field images of speckle patterns formed by optical waves transmitted through a disordered porous silica glass sample are measured. The corresponding 2D intensity correlation function, C, is extracted. The subwavelength spatial resolution of near-field microscopy allows us to resolve in the spatial distribution of C the expected subwavelength oscillations and to follow their dependence on the excitation wavelength. Finally. we deduce the effective refractive index of the material by fitting the theoretical spatial dependence of C to our experimental results.

Journal/Review: JOURNAL OF MICROSCOPY

Volume: 209 (3)      Pages from: 173  to: 176

KeyWords: Glass; silicon dioxide, article; correlation analysis; oscillation; priority journal; refraction index; scanning near field optical microscopy
DOI: 10.1046/j.1365-2818.2003.01092.x

ImpactFactor: 1.779
Citations: 2
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