Nonlinear characterization of nanometer-thick dielectric layers by surface plasmon resonance techniques
Year: 2003
Authors: Margheri G., Giorgetti E., Sottini S., Toci G.
Autors Affiliation: Ist. di Fis. Appl. Nello Carrara, Consiglio Nazionale delle Ricerche, Via Panciatichi 64, 50127 Florence, Italy
Abstract: The nonlinear characterization of nanometer-thick dielectric layers was performed. The surface plasmon resonance techniques were used for the purpose. The off-resonant intensity-dependent refractive index of 10-200-nm-thick films of the soluble polycarbazolyldiacetylene 1,6-bis-(3,6-dihexadecyl-N-carbazolyl)-2,4-hexadiyne deposited upon silver was measured at 1064 nm.
Journal/Review: JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS
Volume: 20 (4) Pages from: 741 to: 751
KeyWords: Dielectric materials; Nanostructured materials; Surface plasmon resonance, Optical mixing, Nonlinear opticsDOI: 10.1364/JOSAB.20.000741ImpactFactor: 2.122Citations: 17data from “WEB OF SCIENCE” (of Thomson Reuters) are update at: 2024-11-10References taken from IsiWeb of Knowledge: (subscribers only)Connecting to view paper tab on IsiWeb: Click hereConnecting to view citations from IsiWeb: Click here