Nonlinear characterization of nanometer-thick dielectric layers by surface plasmon resonance techniques

Year: 2003

Authors: Margheri G., Giorgetti E., Sottini S., Toci G.

Autors Affiliation: Ist. di Fis. Appl. Nello Carrara, Consiglio Nazionale delle Ricerche, Via Panciatichi 64, 50127 Florence, Italy

Abstract: The nonlinear characterization of nanometer-thick dielectric layers was performed. The surface plasmon resonance techniques were used for the purpose. The off-resonant intensity-dependent refractive index of 10-200-nm-thick films of the soluble polycarbazolyldiacetylene 1,6-bis-(3,6-dihexadecyl-N-carbazolyl)-2,4-hexadiyne deposited upon silver was measured at 1064 nm.

Journal/Review: JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS

Volume: 20 (4)      Pages from: 741  to: 751

KeyWords: Dielectric materials; Nanostructured materials; Surface plasmon resonance, Optical mixing, Nonlinear optics
DOI: 10.1364/JOSAB.20.000741

ImpactFactor: 2.122
Citations: 17
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