Back

TEN Papers with more Citations by Dinelli Franco


1) Spatially correlated charge transport in organic thin film transistors in PHYSICAL REVIEW LETTERS
By: Dinelli F., Murgia M., Levy P., Cavallini M., de Leeuw D., Biscarini F. Year: 2004 (IF.: 7.218 Cit.: 558 DOI: 10.1103/PhysRevLett.92.116802)

2) High-mobility ambipolar transport in organic light-emitting transistors in ADVANCED MATERIALS
By: Dinelli F., Capelli R., Loi M.A., Murgia M., Muccini M., Facchetti A., Marks T.J. Year: 2006 (IF.: 7.896 Cit.: 204 DOI: 10.1002/adma.200502164)

3) Supramolecular organization in ultra-thin films of alpha-sexithiophene on silicon dioxide in NATURE MATERIALS
By: Loi M.A., Da Como E., Dinelli F., Murgia R., Zamboni R., Biscarini F., Muccini M. Year: 2005 (IF.: 15.941 Cit.: 196 DOI: 10.1038/nmat1279)

4) Bias-induced threshold voltages shifts in thin-film organic transistors in APPLIED PHYSICS LETTERS
By: Gomes H.L., Stallinga P., Dinelli F., Murgia M., Biscarini F., De Leeuw D. M., Muck T., Geurts J., Molenkamp L.W., Wagner V. Year: 2004 (IF.: 4.308 Cit.: 180 DOI: 10.1063/1.1713035)

5) Correlation between morphology and field-effect-transistor mobility in tetracene thin films in ADVANCED FUNCTIONAL MATERIALS
By: Cicoira F., Santato C., Dinelli F., Loi M.A., Murgia M., Zamboni R., Biscarini F., Heremans P., Muccini M.
Year: 2005 (IF.: 6.770 Cit.: 114 DOI: 10.1002/adfm.200400278)

6) A microstructural study of transparent metal oxide gas barrier films in THIN SOLID FILMS
By: Henry B.M., Dinelli F., Zhao K.-Y., Grovenor C.R.M., Kolosov O.V., Briggs G.A.D., Roberts A.P., Kumar R.S., Howson R.P. Year: 1999 (IF.: 1.101 Cit.: 97 DOI: 10.1016/S0040-6090(99)00461-7)

7) Glass and structural transitions measured at polymer surfaces on the nanoscale in JOURNAL OF THERMAL ANALYSIS AND CALORIMETRY
By: Overney R.M., Buenviaje C., Luginbühl R., Dinelli F. Year: 2000 (IF.: 0.390 Cit.: 96 DOI: 10.1023/A:1010196214867)

8) Ultrasound induced lubricity in microscopic contact in APPLIED PHYSICS LETTERS
By: Dinelli F., Biswas S.K., Briggs G.A.D., Kolosov O.V. Year: 1997 (Cit.: 86 DOI: 10.1063/1.120417)

9) Measurements of stiff-material compliance on the nanoscale using ultrasonic force microscopy in PHYSICAL REVIEW B
By: Dinelli F., Biswas S.K., Briggs G.A.D., Kolosov O.V. Year: 2000 (IF.: 3.065 Cit.: 74 DOI: 10.1103/PhysRevB.61.13995)

10) Mapping surface elastic properties of stiff and compliant materials on the nanoscale using ultrasonic force microscopy in PHILOSOPHICAL MAGAZINE A: PHYSICS OF CONDENSED MATTER, STRUCTURE, DEFECTS AND MECHANICAL PROPERTIES
By: Dinelli F., Castell M.R., Ritchie D.A., Mason N.J., Briggs G.A.D., Kolosov O.V. Year: 2000 (IF.: 1.758 Cit.: 72 DOI: 10.1080/01418610008216474)